McLuhan on Blink Testing

At about the 10-minute mark in this video (from 1968) Marshall McLuhan refers to an expression that he claimed was then in use at IBM: "Information overload leads to pattern recognition." This is central to the idea of what blink testing is all about. He also describes characteristics of the scientist's mindset vs. the artist's mindset, which reminded me of similar patterns that we might see in programmers and testers.Thanks to Adam Goucher for pointing me to the video.